In-Circuit Test

Our world-class test development service offers a choice of test strategies, from unpowered tests with limited digital capabilities to high performance, high capabilities, hence bringing customers options for the right test at the right cost. We perform thorough Design For Testability (DFT) Analysis at no cost in helping customers improving their fab designs, allowing more leverage for future testability. Our test development capabilities includes tests for expected shorts and opens between nodes, unpowered tests for discreet components, testjet or vector less unpowered tests for IC, digital tests, custom ASIC tests, boundary scan test, programming on flash, FPGA, CPLD, EEPROM, micro-controller, etc... We provide consultation on test point reduction through Boundary Scan test (Interconnect and Silicon Nail), Drive-Through Test, Magic test and Cluster Test.

Besides vacuum fixture, we implement pneumatic fixture, fixture with multiple boards for low-volume/complex products, wireless fixture, split fixture for high node count boards, dual-well fixture with throughput multiplier /share-wired capabilities and dual-stage fixture with functional test incorporated. We also design and incorporate fixture electronics (clock buffers, clock dividers, etc.) to improve overall test coverage. We implement Aware Test (ICT & 5DX combination test strategy) to provide test time optimization and test solution to production's de-bottleneck problem.